Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY
| Location: | New York |
|---|---|
| Posted: | Feb 27, 2026 |
| Due: | Mar 6, 2026 |
| Agency: | DEPT OF DEFENSE |
| Type of Government: | Federal |
| Category: |
|
| Solicitation No: | W911PT26QA041 |
| Publication URL: | To access bid details, please log in. |
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- Contract Opportunity Type: Solicitation (Original)
- Original Published Date: Feb 27, 2026 07:59 am EST
- Original Date Offers Due: Mar 06, 2026 03:00 pm EST
- Inactive Policy: 15 days after date offers due
- Original Inactive Date: Mar 21, 2026
-
Initiative:
- None
- Original Set Aside:
- Product Service Code: J036 - MAINT/REPAIR/REBUILD OF EQUIPMENT- SPECIAL INDUSTRY MACHINERY
-
NAICS Code:
- 811210 - Electronic and Precision Equipment Repair and Maintenance
-
Place of Performance:
Watervliet , NY 12189USA
This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached.
*** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. ***
- ACC WATERVLIET ARSENAL 1 BUFFINGTON ST
- WATERVLIET , NY 12189-4050
- USA
- Katja Fox
- katja.fox.civ@army.mil
- Feb 27, 2026 07:59 am ESTSolicitation (Original)
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