Field-Emission Scanning Electron Microscope (FE‑SEM) System
| Location: | Federal |
|---|---|
| Posted: | Jan 20, 2026 |
| Due: | Jan 30, 2026 |
| Agency: | ENERGY, DEPARTMENT OF |
| Type of Government: | Federal |
| Category: |
|
| Solicitation No: | 6-B175-Q-00131-00 |
| Publication URL: | To access bid details, please log in. |
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- Contract Opportunity Type: Solicitation (Original)
- Original Published Date: Jan 20, 2026 02:16 pm CST
- Original Date Offers Due: Jan 30, 2026 05:00 pm CST
- Inactive Policy: Manual
- Original Inactive Date: Jan 30, 2026
-
Initiative:
- None
- Original Set Aside:
- Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
-
NAICS Code:
- 334516 - Analytical Laboratory Instrument Manufacturing
-
Place of Performance:
USA
Argonne National Laboratory is seeking to procure the below. Please refer to the Statement of Work, attached, for further details and requirements.
- Field-Emission Scanning Electron Microscope (FE‑SEM) System
- Installation and Testing
If able to provide the items listed above, please submit your proposal addressing the following requirements by January 30, 2026, at 5:00 PM CST.
For any questions, please contact jdoria@anl.gov no later than Januray 26, 2026, at 12:00 PM CST.
- Signature on Page 1 of this document
-
Proposal - Vendor shall provide two (2) priced configurations:
- Base System (no ultra-fast beam blanker)
- Base System + Optional Ultra-Fast Beam Blanker (meeting the requirement above)
- Lead Time
-
Shipping Origin
- If shipping from outside the USA, please confirm Incoterms of DAP are accepted. Additionally, please provide the appropriateHTS Code associated with order
- If shipping from within the USA, please confirm Incoterms FOB Destination are accepted and that the quoted price includes allcosts associated with the order, and it will be the final price at invoicing.
- Country of Origin
- ANL-70B (Complete)
- 9700 S. Cass Ave
- Lemont , IL 60439
- USA
- Jenna Doria-Garner
- jdoria@anl.gov
- Phone Number 6302526988
- Jan 20, 2026 02:16 pm CSTSolicitation (Original)
Related Document
| Jan 21, 2026 | [Solicitation (Updated)] Field-Emission Scanning Electron Microscope (FE‑SEM) System |
| Jan 26, 2026 | [Solicitation (Updated)] Field-Emission Scanning Electron Microscope (FE‑SEM) System |
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