Mississippi State University
Notice of Proposed Sole Source Purchase
256-111
Mississippi State University anticipates purchasing the item(s) listed below as a
sole source purchase. Anyone objecting to this purchase shall follow the
procedures outlined below.
1. Commodity or commodities to be purchased (make, model, description):
ThermoFisher Scientific Helios 5 Hydra CX DualBeam System: Extreme High Resolution
(XHR) Field Emission Scanning Electron Microscope (FE-SEM) equipped with a
switchable multiple-ion-species (Xe, Ar, O, N) inductively coupled plasma focused ion
beam (ICP-PFIB). It includes an Elstar electron column with UC+ technology, an oil-free
vacuum system, advanced auto-processing application software (AutoTEM 5, Auto Slice
& View 5), and an integrated MultiChem Gas Delivery System. It also has EDS and EBSD
attachments from EDAX that provide needed analysis capability for microstructural
characterization. Preferred Service Agreements providing 2 additional years beyond 1
year warranty of 48-hour targeted onsite labor response, unlimited labor hours, and all
necessary spare parts.
ThermoFisher Scientific Spectra 200 S/TEM: Field Emission Scanning Transmission
Electron Microscope operating across a 30–200 kV high-tension range. It is equipped
with an Ultra-High Brightness Cold Field Emission Gun (X-CFEG), a probe aberration
corrector (Cs S-CORR), a proprietary Super-X EDS detector integrated into the objective
lens, a 16-megapixel Ceta-S CMOS camera, and an EMPAD 2 (Electron Microscope
Pixelated Array Detector) for advanced 4D-STEM applications. Preferred Service
Agreements providing 2 additional years beyond 1 year warranty of 48-hour targeted
onsite labor response, unlimited labor hours, and all necessary spare parts.
2. Explanation of the need to be fulfilled by this item(s), how is it unique from all other
options, and why it is the only one that can meet the specific needs of the department:
Need:
Mississippi State University’s Institute for Imaging and Analytical Technologies was
named in the Consolidated Appropriations Act, 2026 (Appropriations Act) as the
recipient of a Community Project Funding/Congressionally Directed Spending grant,
referenced as Congressionally Funded Community Project (CFCP) grant. In accordance
with the grant, MSU will acquire two advanced microscopy systems, a plasma-focused
ion beam scanning electron microscope (PFIB-SEM) and a 200 kV aberration-corrected
transmission electron microscope (AC-TEM) to support advanced materials
characterization in the Golden Triangle region. These two advanced microscopes will be
used to support local manufacturers by giving researchers powerful tools to prepare,
examine, and measure materials at the atomic level, with unique features that improve
accuracy, reduce damage, and provide detailed data not possible with other equipment.
Key unique capabilities include:
ThermoFisher Scientific Helios 5 Hydra CX DualBeam System:
• Multi-Ion Species Plasma FIB: The Helios 5 Hydra features a unique ICP-PFIB
column that can seamlessly switch between four ion species (Xenon, Argon,
Oxygen, and Nitrogen). This unique ability to select the ion source enables
preparation and analysis of large, high-quality samples with minimal damage to
the material. The Hydra platform provides multiple ion species and flexible
milling conditions that are important for complex material systems. This
capability allows researchers to study defects, grain boundaries, cracks,
precipitates, and three-dimensional microstructures with higher accuracy and
reliability. The integrated workflow also improves sample preparation for high-
resolution TEM and atom probe studies, which are essential for the proposed
characterization program. The Hydra system offers a level of versatility that
allows researchers to avoid damaging samples or creating unwanted chemical
changes. No other manufacturer offers the four ion species capability.
• Extreme High-Resolution Optics: The electron gun utilizes proprietary UC+
technology to reduce the beam energy spread below 0.2 eV, enabling sub-
nanometer resolution (0.6 nm to 1.1 nm) and high surface sensitivity at ultra-low
landing energies (down to 20 V). This capability is unique to this manufacturer.
ThermoFisher Scientific Spectra 200 S/TEM:
• EMPAD-2 Detector: The Spectra 200 features the proprietary EMPAD 2 detector,
which captures full diffraction patterns at every individual pixel at a 10 kHz
readout rate with an expansive dynamic range (>10⁷). This allows direct phase
contrast imaging, ptychography, and precise strain analysis on a single platform.
This capability is critical for strain mapping, defect characterization, precipitate
analysis, and diffraction-based metrology in complex alloy systems. The EMPAD-
2 is exclusive to this instrument and provides the measurement accuracy,
signal range, and integrated workflow needed for the proposed
characterization program.
• Mechanical & Thermal Stability: The Spectra 200 features a 300 mm diameter
column integrated inside a specialized acoustic enclosure that dampens
environmental fluctuations, enabling highly reproducible atomic-scale spatial
resolution. Its ConstantPower lens design minimizes thermal stabilization time
when switching modes, providing maximum stability regardless of lens settings.
This capability is unique to this manufacturer.
• Integrated EDS System: The Super-X EDS detector integrates an array of four
silicon drift EDS detectors directly into the objective lens, achieving a high
collection efficiency solid angle of 0.7 srad with extremely low shadowing. This
vendor offers a completely native EDS hardware and software ecosystem
delivering live drift-corrected elemental quantification at the exact speed of the
microscope scan. This capability is unique to this manufacturer.
3. Name of company/individual selling the item and why that source is the only possible
source that can provide the required item(s):
Selling Entity: FEI Company (An affiliate/part of Thermo Fisher Scientific).
Address: 5350 NE Dawson Creek Drive, Hillsboro, Oregon 97124.
Primary Contact / Account Manager: Lane Wooten, Senior Account Manager (Phone:
+1 470-277-9553 | Email: lane.wooten@thermofisher.com).
FEI Company/Thermo Fisher Scientific is the original equipment manufacturer (OEM),
developer, and sole direct distributor of the integrated platform comprising the Helios 5
Hydra CX DualBeam System and the Spectra 200 S/TEM. The core sub-systems, highly
specialized components, and unified operation software are proprietary intellectual
property exclusive to this company. Major underlying technologies embedded natively
within these systems cannot be procured anywhere else. No third-party distributors or
alternative instrumentation vendors are authorized or legally capable of supplying these
specific configurations.
4. Estimated cost of item(s) and an explanation why the amount to be expended is
considered reasonable:
Estimated Grand Total Cost: $5,186,011.
Total Value of Equipment (List Price): $11,745,479
Total Negotiated Discount Applied: $6,559,468
Through institutional negotiations with FEI Company (Thermo Fisher Scientific), the
department secured a 55.85% price reduction across the bundled package.
The standalone retail price for the Helios 5 Hydra CX system configuration sits at
$5,845,665
The standalone retail price for the Spectra 200 S/TEM system configuration sits at
$5,899,814
By capitalizing on a coordinated "Two Tool Bundle" procurement protocol, the
university is successfully acquiring $11,745,479 worth of state-of-the-art
instrumentation for $5,186,011 saving the university over $6.5 million in capital
equipment outlays.
This bundle includes advanced application software packages including AutoTEM 5,
Autoscript, Auto Slice and View 5, Maps3 and Avizo that traditionally command steep
individual licensing fees.
Additionally, the quote includes Uninterruptible Power Supply (UPS) for both
instruments to protect the instrument against power surges and outages.
The cost includes Preferred Service Agreements for both standalone platforms
extending for 2 full years past the baseline 1 year factory warranty. This tier provides 4-
hour targeted phone triage, a strict 48-hour targeted on-site engineering labor arrival,
comprehensive coverage of all factory-certified spare parts, annual preventative
maintenance interventions, and free functional software updates.
5. Explanation of the efforts taken by the department to determine whether this is the
only source and the efforts used to obtain the best possible price:
The Institute for Imaging and Analytical Technologies (I2AT) is a university-wide research
institute and core facility which meets MSU's missions in research, teaching, and service.
I2AT houses major research instrumentation that is available to the entire university,
industry partners, and other universities across the state.
The department conducted a thorough, multi-phase technical evaluation of the electron
microscopy market to identify platforms capable of supporting our advanced material
characterization needs. This involved evaluating technical specifications, product
portfolios, and demos from major global manufacturers of high-end electron
microscopes (specifically JEOL, TESCAN, and Hitachi).
The market screening proved that alternative platforms fail to meet the department's
operational needs for the following reasons:
FIB Limitations: Alternative vendors (such as TESCAN and JEOL) only offer single-species
plasma focused ion beams (typically Xenon-only). Thermo Fisher Scientific Helios 5
Hydra CX stands uniquely alone with its patented Inductively Coupled Plasma (ICP)
column that switches between four distinct gases (Xenon, Argon, Oxygen, and
Nitrogen) via software control in under 10 minutes. The multi-ion species provides
researchers with the ability to optimize milling rates and minimize damage across
complex multilayer materials. While alternative market configurations may attempt to
supplement a baseline Xenon system with a separate, auxiliary Argon ion gun
attachment, such workarounds fail to meet our technical requirements. A secondary
hardware attachment lacks the nanometer-scale focus, spatial resolution, and optical
alignment of a primary column, making it incapable of site-specific, automated TEM
lamella preparation required for our sensitive multi-material workflows. Without this
feature, structural artifacts, phase transformations, and severe curtaining or
amorphization may occur at the delicate material interfaces of sensitive polymers, light
alloys, biological and energy storage materials. Such degradation is unacceptable for
data-integrity reasons, as it obscures the true atomic scale boundaries of the samples,
compromising the subsequent S/TEM strain-mapping and ptychography data, ultimately
impairing active federally funded research deliverables.
S/TEM Limitations: To conduct atomic-scale strain mapping and ptychography, the
department requires a high-dynamic-range pixelated direct electron detector that
natively bridges the microscope’s automation scripts. Competing TEM manufacturers
must source third-party aftermarket detectors (such as Gatan or Quantum Detectors)
that run on disconnected software and suffer from severe pixel saturation under
standard analytical beam currents. The proprietary EMPAD 2 detector included on the
Spectra 200 platform operates continuously at a true 10 kHz frame rate with a large
dynamic range (>107) that handles intense unscattered beams safely, natively
embedded within the core Velox control software.
Additionally, in a multi-user core facility, competing systems suffer from substantial
thermal drift and 30–60 minutes of stabilization downtime whenever users switch
settings (High Tension and probe current) for atomic-resolution imaging. The Spectra
200 eliminates this bottleneck via a factory-integrated acoustic enclosure and
proprietary ConstantPower™ lenses that maintain a perfectly flat thermal profile. This
eliminates user-to-user stabilization delays, maximizing facility throughput with
immediate, highly reproducible atomic-scale resolution.
To ensure the best possible value to the University, the department conducted a
comprehensive evaluation of available PFIB and S/TEM systems from the major
manufacturers capable of serving this application. The evaluation included a review of
This is the opportunity summary page. It provides an overview of this opportunity and a preview of the attached documentation.