| Location: | Maryland |
|---|---|
| Posted: | Dec 5, 2024 |
| Due: | Dec 19, 2024 |
| Agency: | COMMERCE, DEPARTMENT OF |
| Type of Government: | Federal |
| Category: |
|
| Solicitation No: | NIST-SS25-CHIPS-0039 |
| Publication URL: | To access bid details, please log in. |
APEX Accelerators are an official government contracting resource for small businesses. Find your local APEX Accelerator (opens in new window) for free government expertise related to contract opportunities.
APEX Accelerators are funded in part through a cooperative agreement with the Department of Defense.
The APEX Accelerators program was formerly known as the Procurement Technical Assistance Program (opens in new window) (PTAP).
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government’s anticipated needs.
BACKGROUND
The National Institute of Standards and Technology (NIST) requires an X-ray Photoelectron Spectroscopy (XPS) System to support activities related the semiconductor research, CHIPS for America related projects and other research and standards activities specific to advancing the NIST mission. Specifically, some of the required measurements and conditions include, but are not limited to, quantitatively evaluating materials’ surface (less than 10 nm) elemental and chemical composition; probing the chemical state of semiconductor materials; removing contaminants in a minimally destructively fashion to retain chemical information; probing chemistry of buried interfaces (10 nm – 30 nm); measuring non-conductive surfaces; evaluating band structure of materials (especially semiconductors); and performing data collection in an automated fashion. The XPS system must also be capable of being expanded to include an attached chamber for sample processing and preparation. This equipment will support NIST activities, such as those related to CHIPS for America Metrology Program including, but not limited to, Nanometer-scale Planar Reference Materials; Metrology of Materials, Surfaces and Processes for Hybrid-advanced Packaging; and Electrodeposition for Interconnect Materials and Packaging, as well as many other projects.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above.
REQUIREMENTS:
1.1. Base Ultra High Vacuum (UHV) System
1.1.1. All required components necessary to operate an XPS at UHV conditions
1.1.1.1. Pbase
1.1.1.2. X-ray shielding
1.1.1.3. All necessary mechanical, turbomolecular and ion vacuum pumps to achieve and maintain Pbase.
1.1.1.4. Fully interlocked to protect the user and the system from damage. Bypass of interlock password protected
1.1.2. All required vacuum gauges to be able to independently measure each chamber’s pressure
1.1.3. Windows (leaded) for monitoring the samples, or cameras capable of providing live images of samples within all chambers
1.1.4. Valves
1.1.4.1. All valves needed to isolate the main analysis chamber from any other attached chambers.
1.2. X-ray sources
1.2.1. Aluminum kα anode (E= 1486.6 eV) within the X-ray source
1.2.2. Anode capable of generating high energy X-rays for HAXPES
1.2.3. Monochromator designed to remove proximate x-ray lines/satellites from all the aforementioned anodes.
1.2.4. Automation, computer-controlled transitioning between x-ray types outlined in 1.1.1 and 1.1.2. and as it pertains to adjusting the monochromator outlined in 1.1.3
1.2.5. Multiple spots per anode for x-ray generation.
1.3. Analyzer / Detector specifications for routine spectroscopy
1.3.1. Hemispherical analyzer
1.3.1.1. Fixed analyzer transmission
1.3.1.2. Energy range capable of accessing photoelectron spectra from both Monochromatic Al x-rays and the HAXPES source outlined in 1.1.1 and 1.1.2
1.3.1.3. Ultimate energy resolution with monochromated Al X-rays defined by FWHM (Ag 3d5)
1.3.1.4. Small Spot spectroscopy
1.3.1.4.1. 15 micrometer spot or less must be achievable and demonstrated
1.3.1.4.2. Demonstrate energy resolution explained in 1.2.1.3 when using a 15 micrometers area of analysis.
1.3.1.5. Imaging, including stitched imaging, by XPS must be demonstrated.
1.4. Sample entry/ manipulation.
1.4.1. Independently pumped load lock
1.4.2. Optical camera available to monitor and understand orientation of sample
1.4.3. Computer controlled sample entry from load lock
1.5. Sample stage/Sample holders
1.5.1. Capable 5-axis of movement (x, y, z, rotational, tilt (angle resolved))
1.5.2. Large area (
1.5.3. Capable of computer control using predefined positions of analysis
1.6. Charge neutralization.
1.6.1. Capable of resolving spectra from non-conductive samples
1.7. System must be able to perform both Gas Cluster Ion Beam and Monotonic Argon Ion milling.
1.7.1. Independently pumped; separate from 1.4
1.8. Ultraviolet Photoelectron Spectroscopy and Low Energy Inverse Photoelectron Spectroscopy (LEIPS) capabilities
1.9. Computers/Software/Data
1.9.1. Software capable of running all attached components to the XPS system in an automated fashion.
1.9.2. Computers must be supplied capable of operating the XPS system and able to interface with internal networks via ethernet connections.
1.9.3. Data, including all information necessary to perform a complete analysis, (e.g. transmission functions, rsf values) must be exportable in a non-proprietary format capable of being evaluated by third party software (e.g. .csv, .vms, etc) for a given data file.
1.10. Information on auxiliary chambers with the following characteristics are of interest.
1.10.1. Attached chamber separated by manual valve.
1.10.2. UHV compatible.
1.10.3. Transfer vessels may be attached.
1.10.4. Independent vacuum pumping system
1.10.5. Capable of loading a large sample holder.
1.10.6. Translatable arm capable of transferring sample holder into analysis chamber upon achieving UHV to a position capable of automated transfer.
2. Additional Tools/Information
2.1. Manuals, specifications, model and serial numbers, operating parameters, etc.
2.2. General information on other tools attached to the XPS system (e.g Ion Scattering Spectroscopy, Reflected electron energy loss spectroscopy, etc)
2.3. Warranty information
2.4. Options for full-service contract after Warranty expires.
HOW TO RESPOND TO THIS NOTICE
In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. Please include only the following information, readable in either Microsoft Word 365, Microsoft Excel 365, or .pdf format, in the response: Submit the response by email to the Primary Point of Contact and, if specified, to the Secondary Point of Contact listed in this notice as soon as possible, and preferably before the closing date and time of this notice. Please note that to be considered for award under any official solicitation, the entity must be registered and “active” in SAM at the time of solicitation response.
QUESTIONS REGARDING THIS NOTICE
Questions regarding this notice may be submitted via email to the Primary Point of Contact and the Secondary Point of Contact listed in this notice. Questions should be submitted so that they are received by 11:00 AM Eastern Time on November 12, 2024. If the Contracting Officer determines that providing a written amendment to this notice to document question(s) received would benefit other potential respondents, the questions would be anonymized, and a written response to such question(s) would be provided via an amendment to this notice.
IMPORTANT NOTES
This notice is for market research purposes and should not be construed as a commitment by NIST to issue a solicitation or ultimately award a contract. There is no solicitation available at this time.
This notice does not obligate the Government to award a contract or otherwise pay for the information provided in response.
NIST reserves the right to use information provided by respondents for any purpose deemed necessary and legally appropriate.
Any organization responding to this notice should ensure that its response is complete and sufficiently detailed to allow the Government to determine the organization’s capability.
Respondents are advised that the Government is under no obligation to acknowledge receipt of the information received or provide feedback to respondents with respect to any information submitted.
After a review of the responses received, a synopsis and solicitation may be published on GSA’s eBuy or SAM.gov. However, responses to this notice will not be considered an adequate response to any such solicitation(s).
Thank you for taking the time to submit a response to this request!

With GovernmentContracts, you can:
...(LHVLU) AGFA D4 14x17 NIF (LHQ9N) Radiographic Processing Chemicals The below chemicals... are ...
DEPT OF DEFENSE
Bid Due: 11/11/2028
...D5 14x17 NIF (LHVLU) AGFA D4 14x17 NIF (LHQ9N) Radiographic Processing Chemicals The ...
DEPT OF DEFENSE
Bid Due: 11/11/2028
...(LHQ9N) Radiographic Processing Chemicals The below chemicals are utilized in the processing of ...
Federal Agency
Bid Due: 11/11/2028
...D5 14x17 NIF (LHVLU) AGFA D4 14x17 NIF (LHQ9N) Radiographic Processing Chemicals The ...
DEPT OF DEFENSE
Bid Due: 11/11/2028