Annual Maintenance of FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope for Benet Laboratories, Watervliet, NY
| Location: | New York |
|---|---|
| Posted: | Mar 24, 2025 |
| Due: | Mar 31, 2025 |
| Agency: | DEPT OF DEFENSE |
| Type of Government: | Federal |
| Category: |
|
| Solicitation No: | W911PT25Q0053 |
| Publication URL: | To access bid details, please log in. |
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- Contract Opportunity Type: Solicitation (Original)
- Original Published Date: Mar 24, 2025 08:58 am EDT
- Original Date Offers Due: Mar 31, 2025 01:00 pm EDT
- Inactive Policy: 15 days after date offers due
- Original Inactive Date: Apr 15, 2025
-
Initiative:
- None
- Original Set Aside:
- Product Service Code: J036 - MAINT/REPAIR/REBUILD OF EQUIPMENT- SPECIAL INDUSTRY MACHINERY
-
NAICS Code:
- 811210 - Electronic and Precision Equipment Repair and Maintenance
-
Place of Performance:
Watervliet , NY 12189USA
Solicitation of services to provide: annual maintenance for FEI Helios 600i Focused Ion Beam (FEB) / Scanning Electron Microscope at Benet Laboratories, Watervliet, NY per Performance Work Statement for one year.
Service Contract Labor Standards do not apply.
This is a Sole Source Procurement with FEI Company. All Responsible Proposals will be Considered.
- ACC WATERVLIET ARSENAL 1 BUFFINGTON ST
- WATERVLIET , NY 12189-4000
- USA
- Joseph Pokrentowski
- joseph.s.pokrentowski.civ@army.mil
- Phone Number 5182664738
- Mar 24, 2025 08:58 am EDTSolicitation (Original)
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