Atomic Force Microscope for use in a Scanning Electron Microscope

Location: Maryland
Posted: Feb 10, 2026
Due: Feb 19, 2026
Agency: COMMERCE, DEPARTMENT OF
Type of Government: Federal
Category:
  • 66 - Instruments and Laboratory Equipment
Solicitation No: 1333ND26QNB030045
Publication URL: To access bid details, please log in.
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Atomic Force Microscope for use in a Scanning Electron Microscope
Active
Contract Opportunity
Notice ID
1333ND26QNB030045
Related Notice
NIST-SS26-CHIPS-34
Department/Ind. Agency
COMMERCE, DEPARTMENT OF
Sub-tier
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office
DEPT OF COMMERCE NIST
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General Information
  • Contract Opportunity Type: Combined Synopsis/Solicitation (Original)
  • Original Published Date: Feb 10, 2026 10:21 am EST
  • Original Date Offers Due: Feb 19, 2026 05:00 pm EST
  • Inactive Policy: 15 days after date offers due
  • Original Inactive Date: Mar 06, 2026
  • Initiative:
    • None
Classification
  • Original Set Aside: No Set aside used
  • Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
  • NAICS Code:
    • 334516 - Analytical Laboratory Instrument Manufacturing
  • Place of Performance:
    Gaithersburg , MD 20899
    USA
Description

Please see attached combined synopsis/solicitation.


Attachments/Links
Contact Information
Contracting Office Address
  • ACQUISITION MANAGEMENT DIVISION 100 BUREAU DR.
  • GAITHERSBURG , MD 20899
  • USA
Primary Point of Contact
Secondary Point of Contact


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