Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)

Location: Maryland
Posted: Apr 6, 2026
Agency: COMMERCE, DEPARTMENT OF
Type of Contract: Awards
Type of Government: Federal
Category:
  • 59 - Electrical and Electronic Equipment Components
Solicitation No: 1333ND26PNB030039
Publication URL: To access bid details, please log in.
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Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
Active
Contract Opportunity
Notice ID
1333ND26PNB030039
Related Notice
Contract Line Item Number
Department/Ind. Agency
COMMERCE, DEPARTMENT OF
Sub-tier
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office
DEPT OF COMMERCE NIST
Award Details
  • Contract Award Date: Mar 27, 2026
  • Contract Award Number: 1333ND26PNB030039
  • Task/Delivery Order Number:
  • Contractor Awarded Unique Entity ID: CL4ELDSNT465
  • Contractor Awarded Name: FEI COMPANY
  • Contractor Awarded Address: Hillsboro , OR 97124 USA
  • Base and All Options Value (Total Contract Value): $4,486,721.00
General Information
  • Contract Opportunity Type: Award Notice (Original)
  • Original Published Date: Apr 06, 2026 10:42 am EDT
  • Inactive Policy: 15 days after contract award date
  • Original Inactive Date: Apr 11, 2026
  • Initiative:
    • None
Classification
  • Original Set Aside: No Set aside used
  • Product Service Code: 5961 - SEMICONDUCTOR DEVICES AND ASSOCIATED HARDWARE
  • NAICS Code:
    • 334516 - Analytical Laboratory Instrument Manufacturing
  • Place of Performance:
    MD 20899
    USA
Description
Attachments/Links
Contact Information
Contracting Office Address
  • ACQUISITION MANAGEMENT DIVISION 100 BUREAU DR.
  • GAITHERSBURG , MD 20899
  • USA
Primary Point of Contact
Secondary Point of Contact
History
  • Apr 06, 2026 10:42 am EDTAward Notice (Original)
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