Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
| Location: |
Maryland |
| Posted: |
Apr 6, 2026 |
| Agency: |
COMMERCE, DEPARTMENT OF |
| Type of Contract: |
Awards |
| Type of Government: |
Federal |
| Category: |
- 59 - Electrical and Electronic Equipment Components
|
| Solicitation No: |
1333ND26PNB030039 |
| Publication URL: |
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Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
Active
Contract Opportunity
Notice ID
1333ND26PNB030039
Contract Line Item Number
Department/Ind. Agency
COMMERCE, DEPARTMENT OF
Sub-tier
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office
DEPT OF COMMERCE NIST
Award Details
General Information
-
Contract Opportunity Type: Award Notice (Original)
-
Original Published Date: Apr 06, 2026 10:42 am EDT
-
Inactive Policy: 15 days after contract award date
-
Original Inactive Date:
Apr 11, 2026
-
Initiative:
Classification
-
Original Set Aside: No Set aside used
-
Product Service Code: 5961 - SEMICONDUCTOR DEVICES AND ASSOCIATED HARDWARE
-
NAICS Code:
-
334516 - Analytical Laboratory Instrument Manufacturing
-
Place of Performance:
MD
20899
USA
Description
Attachments/Links
Contact Information
Contracting Office Address
-
ACQUISITION MANAGEMENT DIVISION 100 BUREAU DR.
-
GAITHERSBURG , MD 20899
-
USA
Secondary Point of Contact
History
-
Apr 06, 2026 10:42 am EDTAward Notice (Original)
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See also
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