| Location: | Maryland |
|---|---|
| Posted: | Dec 4, 2025 |
| Due: | Dec 18, 2025 |
| Agency: | COMMERCE, DEPARTMENT OF |
| Type of Government: | Federal |
| Category: |
|
| Solicitation No: | NIST-SS26-CHIPS-31 |
| Publication URL: | To access bid details, please log in. |
APEX Accelerators are an official government contracting resource for small businesses. Find your local APEX Accelerator (opens in new window) for free government expertise related to contract opportunities.
APEX Accelerators are funded in part through a cooperative agreement with the Department of Defense.
The APEX Accelerators program was formerly known as the Procurement Technical Assistance Program (opens in new window) (PTAP).
***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government’s anticipated needs. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Panoscientific, LLC, 4425 Seneca Ave, Cocoa, FL 32926, US, under the authority of FAR 13.106-1(b)(1)(i). The North American Industry Classification System (NAICS) code for this acquisition is 334516, Analytical Laboratory Instrument Manufacturing.
BACKGROUND
The NIST Physical Measurement Laboratory (PML), Microsystems and Nanotechnology Division (MND), CHIPS R&D Program (https://www.nist.gov/chips/metrology-community) as part of the CHIPS Act activities (Grand Challenge 5: Modeling and Simulating Semiconductor Manufacturing Processes), is now developing imaging and measurement solutions for integrated circuit (IC) overlay metrology using a scanning electron microscope (SEM). IC production relies on measurements of the 3D size, shape, and placement of structures with atomic-level precision and repeatability. The project, titled “SEM Overlay Metrology Based on Physics Model and Artificial Intelligence,” will create a sound scientific foundation and comprehensive solutions for SEM-based overlay and dimensional metrology superior to currently used arbitrary methods. This will allow the design of overlay patterns, acquisition, and image analysis to be optimized entirely through artificial intelligence, physics-based simulation, and modeling and meet IC production requirements now and in the future. For this work, samples that contain patterns used for overlay measurements and relevant to current IC technologies are indispensable.
The NIST MND requires special hardware, a so-called compressed sensing scan generator suitable for SEM-based measurements of IC overlay structures to acquire images significantly faster than traditional full-frame scanning. This can be achieved by finding the area of interest in the field of view and generating images. The compressed sensing scan generator solution must be able to acquire images of the whole field of view very quickly, compensate for the inherent noise with inpainting, denoising, and other image processing algorithms, identify the area of interest, and acquire the final image pixels with the necessary signal-to-noise ratio. This can only be done efficiently with the use of artificial intelligence (AI) that automatically optimizes the image acquisition process.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:
Line Item 0001: Compressed sensing scan generator
Quantity: 1
Technical Specifications:
Option Line Item 0002: Scan distortion correction for high-accuracy images
Quantity: 1
Technical Specifications:
Option Line Item 0003: Point spread function deconvolution software
Quantity: 1
Technical Specifications
NIST conducted market research from February through December 2025 by performing internet searches, reviewing product literature, and speaking with vendors to determine what sources could meet NIST’s minimum requirements. The results of that market research revealed that only Panoscientific, LLC (UEI: V62THLURW7D1) appears to be capable of meeting NIST’s requirements.
HOW TO RESPOND TO THIS NOTICE
In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. Please include only the following information, readable in either Microsoft Word 365, Microsoft Excel 365, or .pdf format, in the response: Submit the response by email to the Primary Point of Contact and, if specified, to the Secondary Point of Contact listed in this notice as soon as possible, and preferably before the closing date and time of this notice. Please note that to be considered for award under any official solicitation, the entity must be registered and “active” in SAM at the time of solicitation response.
QUESTIONS REGARDING THIS NOTICE
Questions regarding this notice may be submitted via email to the Primary Point of Contact and the Secondary Point of Contact listed in this notice. Questions should be submitted so that they are received 5 calendar days prior to the response date. If the Contracting Officer determines that providing a written amendment to this notice to document question(s) received would benefit other potential respondents, the questions would be anonymized, and a written response to such question(s) would be provided via an amendment to this notice.
IMPORTANT NOTES
This notice is for market research purposes and should not be construed as a commitment by NIST to issue a solicitation or ultimately award a contract. There is no solicitation available at this time.
This notice does not obligate the Government to award a contract or otherwise pay for the information provided in response.
NIST reserves the right to use information provided by respondents for any purpose deemed necessary and legally appropriate.
Any organization responding to this notice should ensure that its response is complete and sufficiently detailed to allow the Government to determine the organization’s capability.
Respondents are advised that the Government is under no obligation to acknowledge receipt of the information received or provide feedback to respondents with respect to any information submitted.
After a review of the responses received, a synopsis and solicitation may be published on GSA’s eBuy or SAM.gov. However, responses to this notice will not be considered an adequate response to any such solicitation(s).
The responses shall not exceed 10 pages including all attachments, charts, etc.
Thank you for taking the time to submit a response to this request!

With GovernmentContracts, you can:
...RFID-Integrated Sensor Systems High-frame rate, foveated 3D imaging system Self-Calibrating Camera... Networks for ...
Department of Commerce
Bid Due: 1/22/2038
...delivery, and disease modeling that depend on reliable embryonic manipulation. Ultrasound guidance... Visualsonics ...
HEALTH AND HUMAN SERVICES, DEPARTMENT OF
Bid Due: 6/05/2026