Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument

Location: Maryland
Posted: Feb 9, 2026
Due: Feb 23, 2026
Agency: COMMERCE, DEPARTMENT OF
Type of Government: Federal
Category:
  • 66 - Instruments and Laboratory Equipment
Solicitation No: 1333ND26QNB030053
Publication URL: To access bid details, please log in.
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Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument
Active
Contract Opportunity
Notice ID
1333ND26QNB030053
Related Notice
Department/Ind. Agency
COMMERCE, DEPARTMENT OF
Sub-tier
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office
DEPT OF COMMERCE NIST
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General Information
  • Contract Opportunity Type: Combined Synopsis/Solicitation (Original)
  • Original Published Date: Feb 09, 2026 04:31 pm EST
  • Original Date Offers Due: Feb 23, 2026 04:30 pm EST
  • Inactive Policy: 15 days after date offers due
  • Original Inactive Date: Mar 10, 2026
  • Initiative:
    • None
Classification
  • Original Set Aside: No Set aside used
  • Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
  • NAICS Code:
    • 334516 - Analytical Laboratory Instrument Manufacturing
  • Place of Performance:
    Gaithersburg , MD 20899
    USA
Description

This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.


Attachments/Links
Contact Information
Contracting Office Address
  • ACQUISITION MANAGEMENT DIVISION 100 BUREAU DR.
  • GAITHERSBURG , MD 20899
  • USA
Primary Point of Contact
Secondary Point of Contact
History
  • Feb 09, 2026 04:31 pm ESTCombined Synopsis/Solicitation (Original)
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