Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument
| Location: | Maryland |
|---|---|
| Posted: | Feb 9, 2026 |
| Due: | Feb 23, 2026 |
| Agency: | COMMERCE, DEPARTMENT OF |
| Type of Government: | Federal |
| Category: |
|
| Solicitation No: | 1333ND26QNB030053 |
| Publication URL: | To access bid details, please log in. |
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- Contract Opportunity Type: Combined Synopsis/Solicitation (Original)
- Original Published Date: Feb 09, 2026 04:31 pm EST
- Original Date Offers Due: Feb 23, 2026 04:30 pm EST
- Inactive Policy: 15 days after date offers due
- Original Inactive Date: Mar 10, 2026
-
Initiative:
- None
- Original Set Aside: No Set aside used
- Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
-
NAICS Code:
- 334516 - Analytical Laboratory Instrument Manufacturing
-
Place of Performance:
Gaithersburg , MD 20899USA
This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.
- ACQUISITION MANAGEMENT DIVISION 100 BUREAU DR.
- GAITHERSBURG , MD 20899
- USA
- Nina Lin
- nina.lin@nist.gov
- Forest Crumpler
- forest.crumpler@nist.gov
- Feb 09, 2026 04:31 pm ESTCombined Synopsis/Solicitation (Original)
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