Broad Ion Beam Milling System

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This is a Sources Sought Notice only. This is not a request for proposal, but a survey to locate potential sources. This Sources Sought does not constitute an Invitation for Bids, Request for Proposals, or a Request for Quotations, and is not to be construed as a commitment by the Government to issue an order or otherwise pay for the information solicited, nor is it a guarantee of a forthcoming solicitation or contract. It is for market research purposes only. Respondents will not be notified of the results of the evaluation.

The purpose of this Sources Sought Notice is to gain knowledge of interest, capabilities, and qualifications of various members of industry, to include the Small Business Community: Small Business, Section 8(a), Historically Underutilized Business Zones (HUB-Zone), Service-Disabled Veteran-Owned Small Business (SDVOSB), Women-Owned Small Business (WOSB), and Economically Disadvantaged Women-Owned Small Business (EDWOSB). The Government must ensure there is adequate competition among the potential pool of responsible contractors. Small business, Section 8(a), HUBZone, SDVOSB, WOSB, & EDWOSB businesses are highly encouraged to participate.

NAICS Code: 334516 ANALYTICAL LABORATORY INSTRUMENT MANUFACTURING

NAICS Size Standard: 1,000 Employees

Subject: Broad Ion Beam Milling System

Sources Sought Closing Response Date: Four (4) Calendar days after posting.

Contact Point: Rafael Anderson, rlanderson@usgs.gov

Objective: To find sources that are qualified to meet the supplies/services as listed below. Note that the specific requirements are subject to change prior to the release of any solicitation.

The agency requires is in need of a broad ion beam (BIB) milling system for improved preparation of geologic samples. BIB milling techniques improve the surface of mechanically polished geologic samples by sputtering the surface with accelerated argon ions. The ion-solid interactions generated by the milling instrument create a flatter and more finely polished sample surface than what can be achieved with traditional methods. Samples are then analyzed using the high-resolution capabilities of the Geology, Energy and Minerals Microanalysis (GEMMa) Laboratory's field emission scanning electron microscope to observe and document nanometer-scale features.
Broad Ion Beam (BIB)Milling system requirements:
Preparation of both flat and cross-sectional milling applications
Either a single or dual beam system
Argon gas source
Ion beam energy range (100eV to 16keV)
Ion gun angles (0-90°)
Stage requirements:
-        Sample size ¿ up to 32 mm (d) x 28mm (h)
-        Stage rotation (360°) and rocking/oscillation while milling
-        Sample cooling during milling (i.e., peltier or LN2 cooling methods)
Ability to monitor samples during milling (i.e., optical scope, or optical camera)

Responses: All interested parties should notify this office via e-mail within the posted date. Responses shall include:
(I) To what extent each of the specifications can be met.
(II) Include your type of business (i.e. commercial, academia), whether your organization is classified as a large or small business. If a small business, you must also list any small disadvantaged status you hold [HUBZone, 8(a), Service Disabled Veteran Owned Small Business (SDVOSB), Women Owned Small Business (WOSB), Economically Disadvantaged Women-Owned Small Business (EDWOSB), etc.].

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